Yokohira Tokumi | Faculty Of Engineering Okayama University
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概要
関連著者
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Yokohira Tokumi
Faculty Of Engineering Okayama University
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Okamoto T
Faculty Of Engineering Okayama University Of Science
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Okamoto Takuji
Faculty Of Engineering Okayama Univ.
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Yokohira Tokumi
Faculty Of Engineering Okayama Univ.
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Michinishi Hiroyuki
Faculty Of Engineering Okayama University Of Science
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Michinishi Hiroyuki
Faculty of Engineering, Okayama University
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HONDO Tsutomu
Sharp Takaya Electronic Industry Co., Ltd.
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Hondo Tsutomu
Sharp Takaya Electronics Industry Co. Ltd.
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Hondo Tsutomu
Sharp Takaya Electronic Industry Co. Ltd.
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Kobayashi T
Soc Division Renesas Technology Corporation
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KOBAYASHI Toshifumi
SOC Division, Renesas Technology Corporation
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INOUE Tomoo
Hiroshima City University
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Shimizu T
Kdd R&d Laboratories Inc.
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Inoue T
Hiroshima City Univ. Hiroshima‐shi Jpn
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MICHINISHI Hiroyuki
the Faculty of Engineering, Okayama University of Science
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YOKOHIRA Tokumi
the Faculty of Engineering, Okayama University
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OKAMOTO Takuji
the Faculty of Engineering, Okayama University
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INOUE Tomoo
the Graduate School of Information Science, Nara Institute of Science and Technology
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FUJIWARA Hideo
the Graduate School of Information Science, Nara Institute of Science and Technology
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Fujiwara Hideo
Naist
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Fujiwara Hideo
Nara Institute Of Science And Technology
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Shimizu T
Ntt Network Innovation Lab. Yokosuka‐shi Jpn
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Inoue Tomoo
The Graduate School Of Information Science Nara Institute Of Science And Technology
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Fujiwara Hideo
The Graduate School Of Information Science Nara Institute Of Science And Technology
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Sugiyama Yuji
Faculty Of Engineering Okayama University
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Shimizu Toshimi
Faculty of Engineering, Okayama University
著作論文
- Testing for the Programming Circuit of SRAM-Based FPGAs
- The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs
- Detection of CMOS Open Node Defects by Frequency Analysis(Dependable Computing)
- CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component(Fault Detection)(Test and Verification of VLSI)
- Node Placement Algorithms for Shuffle-Like Packet-Switched Networks with Wavelength-Division Multiplexing(The IEICE Transactions (publishedin Japanese) Vol. J 86-B, No.6(Communications))
- Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits (Special Issue on VLSI Testing and Testable Design)