Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits (Special Issue on VLSI Testing and Testable Design)

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概要

• 論文の詳細を見る

• The locally exhaustive testing of multiple output combinational circuits is the test which provides exhaustive test patterns for each set of inputs on which each output depends. First, this paper presents a sufficient condition under which a minimum test set (MLTS) for the locally exhaustive testing has 2^w test patterns, where w is the maximum number of inputs on which any output depends. Next, we clarify that any CUT with up to four outputs satisfies the condition, independently of w and n, where n is the number of inputs of the CUT. Finally, we clarify that any CUT with five outputs also satisfies the condition for 1≦w≦2 or n-2≦w≦n.

• 社団法人電子情報通信学会の論文
• 1993-07-25

著者

• Okamoto T

  Faculty Of Engineering Okayama University Of Science

• Okamoto Takuji

  Faculty Of Engineering Okayama Univ.

• Yokohira Tokumi

  Faculty Of Engineering Okayama University

• Yokohira Tokumi

  Faculty Of Engineering Okayama Univ.

• Michinishi Hiroyuki

  Faculty of Engineering, Okayama University

• Michinishi Hiroyuki

  Faculty Of Engineering Okayama University Of Science

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• Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits (Special Issue on VLSI Testing and Testable Design)

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