Detection of CMOS Open Node Defects by Frequency Analysis(Dependable Computing)

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概要

• 論文の詳細を見る

• A method to detect open node defects that cannot be detected by the conventional IDDQ test method has previously been proposed employing a sinusoidal wave superposed on the DC supply voltage. The present paper proposes a strategy to improve the detectability of the test method by means of frequency analysis of the supply current. In this strategy, defects are detected by determining whether secondary harmonics of the sinusoidal wave exist in the supply current. The effectiveness of the method is confirmed by experiments on two CMOS NAND gate packages (SSIs).

• 社団法人電子情報通信学会の論文
• 2007-03-01

著者

• HONDO Tsutomu

  Sharp Takaya Electronic Industry Co., Ltd.

• Hondo Tsutomu

  Sharp Takaya Electronics Industry Co. Ltd.

• Hondo Tsutomu

  Sharp Takaya Electronic Industry Co. Ltd.

• Okamoto T

  Faculty Of Engineering Okayama University Of Science

• Okamoto Takuji

  Faculty Of Engineering Okayama Univ.

• Yokohira Tokumi

  Faculty Of Engineering Okayama University

• Yokohira Tokumi

  Faculty Of Engineering Okayama Univ.

• Michinishi Hiroyuki

  Faculty of Engineering, Okayama University

• Kobayashi T

  Soc Division Renesas Technology Corporation

• KOBAYASHI Toshifumi

  SOC Division, Renesas Technology Corporation

• Michinishi Hiroyuki

  Faculty Of Engineering Okayama University Of Science

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