The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs
スポンサーリンク
概要
- 論文の詳細を見る
Any minimum test set (MLTS) for locally exhaustive testing of multiple output combinational circuits (CUTs) has at least 2^ω test patterns, where w is the maximum number of inputs on which any output depends. In the previous researches, it is clarified that every CUT with up to four outputs has an MLTS with 2^ω elements. On the other hand, it can be easily shown that every CUT with more than five outputs does not have such an MLTS. It has not been however known whether every CUT with five outputs has such an MLTS or not. In this paper, it is clarified that every CUT with five outputs has such an MLTS. First, some terminologies are introduced as preliminaries. Second, features of 5×(ω+1) dependence matrices of CUTs with five outputs and (ω+1) inputs are discussed. Third, an equivalence relation between dependence matrices of two CUTs is introduced. The relation means that if it holds and one of the CUTs has an MLTS with 2^ω elements, then the other CUT also has such an MLTS. Based on the features described above, a theorem is established that there exists a 5×ω dependence matrix which is equivalent to each of the above 5×(ω+1) matrices. Finally, it is proved by the use of the theorem that every CUT with five outputs has an MLTS with 2^ω elements.
- 社団法人電子情報通信学会の論文
- 1995-07-25
著者
-
Shimizu T
Kdd R&d Laboratories Inc.
-
Shimizu T
Ntt Network Innovation Lab. Yokosuka‐shi Jpn
-
Okamoto T
Faculty Of Engineering Okayama University Of Science
-
Okamoto Takuji
Faculty Of Engineering Okayama Univ.
-
Yokohira Tokumi
Faculty Of Engineering Okayama University
-
Yokohira Tokumi
Faculty Of Engineering Okayama Univ.
-
Sugiyama Yuji
Faculty Of Engineering Okayama University
-
Shimizu Toshimi
Faculty of Engineering, Okayama University
-
Michinishi Hiroyuki
Faculty of Engineering, Okayama University
-
Michinishi Hiroyuki
Faculty Of Engineering Okayama University Of Science
関連論文
- Testing for the Programming Circuit of SRAM-Based FPGAs
- The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs
- Detection of CMOS Open Node Defects by Frequency Analysis(Dependable Computing)
- CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component(Fault Detection)(Test and Verification of VLSI)
- Recognition of Connected Digit Speech in Japanese Collected over the Telephone Network
- A Portable Text-to-Speech System Using a Pocket-Sized Formant Speech Synthesizer (Special Section on Speech Synthesis: Current Technologies and Equipment)
- Node Placement Algorithms for Shuffle-Like Packet-Switched Networks with Wavelength-Division Multiplexing(The IEICE Transactions (publishedin Japanese) Vol. J 86-B, No.6(Communications))
- Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits (Special Issue on VLSI Testing and Testable Design)