Okamoto T | Faculty Of Engineering Okayama University Of Science

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概要

• OKAMOTO Takujiの詳細を見る
• 同名の論文著者
• Faculty Of Engineering Okayama University Of Scienceの論文著者

関連著者

• Okamoto T

  Faculty Of Engineering Okayama University Of Science

• Yokohira Tokumi

  Faculty Of Engineering Okayama University

• Michinishi Hiroyuki

  Faculty Of Engineering Okayama University Of Science

• Okamoto Takuji

  Faculty Of Engineering Okayama Univ.

• Yokohira Tokumi

  Faculty Of Engineering Okayama Univ.

• Michinishi Hiroyuki

  Faculty of Engineering, Okayama University

• HONDO Tsutomu

  Sharp Takaya Electronic Industry Co., Ltd.

• Hondo Tsutomu

  Sharp Takaya Electronics Industry Co. Ltd.

• Hondo Tsutomu

  Sharp Takaya Electronic Industry Co. Ltd.

• Kobayashi T

  Soc Division Renesas Technology Corporation

• KOBAYASHI Toshifumi

  SOC Division, Renesas Technology Corporation

• INOUE Tomoo

  Hiroshima City University

• Shimizu T

  Kdd R&d Laboratories Inc.

• Inoue T

  Hiroshima City Univ. Hiroshima‐shi Jpn

• MICHINISHI Hiroyuki

  the Faculty of Engineering, Okayama University of Science

• YOKOHIRA Tokumi

  the Faculty of Engineering, Okayama University

• OKAMOTO Takuji

  the Faculty of Engineering, Okayama University

• INOUE Tomoo

  the Graduate School of Information Science, Nara Institute of Science and Technology

• FUJIWARA Hideo

  the Graduate School of Information Science, Nara Institute of Science and Technology

• Fujiwara Hideo

  Naist

• Fujiwara Hideo

  Nara Institute Of Science And Technology

• Shimizu T

  Ntt Network Innovation Lab. Yokosuka‐shi Jpn

• Inoue Tomoo

  The Graduate School Of Information Science Nara Institute Of Science And Technology

• Fujiwara Hideo

  The Graduate School Of Information Science Nara Institute Of Science And Technology

• Sugiyama Yuji

  Faculty Of Engineering Okayama University

• Shimizu Toshimi

  Faculty of Engineering, Okayama University

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著作論文

• Testing for the Programming Circuit of SRAM-Based FPGAs
• The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs
• Detection of CMOS Open Node Defects by Frequency Analysis(Dependable Computing)
• CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component(Fault Detection)(Test and Verification of VLSI)
• Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits (Special Issue on VLSI Testing and Testable Design)

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