Clouqueur Thomas | Nara Institute Of Science And Technology
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概要
関連著者
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Clouqueur Thomas
Nara Institute Of Science And Technology
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Fujiwara Hideo
Nara Inst. Of Sci. And Technol. (naist) Ikoma‐shi Jpn
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FUJIWARA Hideo
Nara Institute of Science and Technology (NAIST)
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Ooi Chia
Nara Institute Of Science And Technology
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SALUJA Kewal
University of Wisconsin-Madison
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Clouqueur Thomas
Nara Institute Of Science And Technology (naist)
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NAKAMURA Yoshiyuki
Nara Institute of Science and Technology (NAIST)
著作論文
- Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch(Dependable Computing)
- A New Class of Sequential Circuits with Acyclic Test Generation Complexity(メモリテイストとテスト生成複雑度,VLSI設計とテスト及び一般)