MIYASE Kohei | Kyushu Institute of Technology

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著作論文

High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme
High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX : A Clock-Gating-Based Test Relaxation and X-Filling Scheme
A Study of Capture-Safe Test Generation Flow for At-Speed Testing
Scan Tree Design: Test Compression with Test Vector Modification (特集:システムLSIの設計技術と設計自動化)
On Delay Test Quality for Test Cubes
A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing
Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing
A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing

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