Yamashita Yoshiyuki | Densotechno Co.

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概要

• YAMATO Yutaの詳細を見る
• 同名の論文著者
• Densotechno Co.の論文著者

関連著者

• WEN Xiaoqing

  Kyushu Institute of Technology

• YAMATO Yuta

  Kyushu Institute of Technology

• Kajihara S

  Kyushu Inst. Technol. Iizuka‐shi Jpn

• Yamashita Yoshiyuki

  Densotechno Co.

• Kajihara Seiji

  Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology

• Xiaoqing Wen

  Department Of Information Engineering Mining College Akita University

• 梶原 誠司

  九州工業大学:jst Crest

• 梶原 誠司

  九州工業大学情報工学部電子情報工学科:九州工業大学マイクロ化総合技術センタ

• Miyase K

  Kyushu Institute Of Technology

• Miyase Kohei

  Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology

• 梶原 誠司

  九州工業大学情報工学部電子情報工学科:九州工業大学マイクロ化システムセンター

• MIYASE Kohei

  Kyushu Institute of Technology

• FURUKAWA Hiroshi

  Kyushu Institute of Technology

• Kajihara Seiji

  Kyushu Insteitute Of Technology

• Kajihara Seiji

  Kyushu Inst. Technol. Iizuka‐shi Jpn

• WANG Laung-Terng

  SynTest

• WEN Xiaoqing

  Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology

• Saluja Kewal

  Department Of Electrical And Computer Engineering University Of Wisconsin-madison

• Saluja Kewal

  Univ. Wisconsin‐madison Usa

• Wen Xiaoqing

  Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology

• Kajihara Seiji

  Faculty Of Engineering Osaka University

• SALUJA KEWAL

  Department of Electrical and Computer Engineering, University of Wisconsin-Madison

• KAJIHARA Seiji

  Kyushu Institute of Technology

• Hatayama Kazumi

  Starc

• Kinoshita Kozo

  Faculty Of Informatics Osaka Gakuin University

• Kinoshita Kozo

  Faculty Of Engineering Osaka University

• TAKASHIMA Atsushi

  Kyushu Institute of Technology

• NODA Kenji

  STARC

• ITO Hideaki

  STARC

• AIKYO Takashi

  STARC

• YAMATO Yuta

  Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology

• Yamato Yuta

  Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology

• Saluja Kewal

  Department Of Electrical & Computer Engineering Uw-madison

• GIRARD Patrick

  LIRMM

• TEHRANIPOOR Mohammad

  University of Connecticut

• SALUJA Kewal

  University of Wisconsin-Madison

• MIYASE Kohei

  Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology

• NAKAMURA Yusuke

  Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology

• MIYASE Kohei

  Innovation Plaza Fukuoka, Japan Science and Technology Agency

• Nakamura Yusuke

  Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology

• YAMATO Yuta

  Fukuoka Industry, Science & Technology Foundation

• YAMATO Yuta

  Fukuoka Industry Science Technology Foundation

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著作論文

• High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX : A Clock-Gating-Based Test Relaxation and X-Filling Scheme
• A Study of Capture-Safe Test Generation Flow for At-Speed Testing
• A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits
• A Per-Test Fault Diagnosis Method Based on the X-Fault Model(Dependable Computing)
• A New Method for Low-Capture-Power Test Generation for Scan Testing(Dependable Computing)
• A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing
• Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing

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