Wen Xiaoqing | Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology

スポンサーリンク

概要

関連著者

もっと見る

著作論文

Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time(Dependable Computing)
Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores(Dependable Computing)
On Detection of Bridge Defects with Stuck-at Tests
A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits
A Novel ATPG Method for Capture Power Reduction during Scan Testing(Dependable Computing)
A Per-Test Fault Diagnosis Method Based on the X-Fault Model(Dependable Computing)
A New Method for Low-Capture-Power Test Generation for Scan Testing(Dependable Computing)
On Design for I_-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies(Computer Components)
Testing Core-Based System-on-a-Chip Designs
Transistor Leakage Fault Diagnosis for CMOS Circuits(Special Issue on Test and Diagnosis of VLSI)
Transistor Leakage Fault Diagnosis with I_DDQ and Logic Information
Testing of k-FR Circuits under Highly Observable Condition

もっと見る

スポンサーリンク