Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time(Dependable Computing)
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概要
- 論文の詳細を見る
LSI testing is critical to guarantee chips are fault-free before they are integrated in a system, so as to increase the reliability of the system. Although full-scan is a widely adopted design-for-testability technique for LSI design and testing, there is a strong need to reduce the test data Volume, scan-in Power dissipation, and test application Time (VPT) of full-scan testing. Based on the analysis of the characteristics of the variable-to-fixed run-length coding technique and the random access scan architecture, this paper presents a novel design scheme to tackle all VPT issues simultaneously. Experimental results on ISCAS'89 benchmarks have shown on average 51.2%, 99.5%, 99.3%, and 85.5% reduction effects in test data volume, average scan-in power dissipation, peak scan-in power dissipation, and test application time, respectively.
- 社団法人電子情報通信学会の論文
- 2006-10-01
著者
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Han Yinhe
Institute Of Computing Technology Chinese Academy Of Sciences
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Li Xiaowei
Institute Of Computing Technology Chinese Academy Of Sciences
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WEN Xiaoqing
Kyushu Institute of Technology
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HU Yu
Institute of Computing Technology, Chinese Academy of Sciences
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LI Huawei
Institute of Computing Technology, Chinese Academy of Sciences
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WEN Xiaoqing
Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology
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Hu Yu
Institute Of Computing Technology Chinese Academy Of Sciences
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Li Huawei
Institute Of Computing Technology Chinese Academy Of Sciences
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Wen Xiaoqing
Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology
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Hu Yu
Institute Of Biomedical Engineering Central South University
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Xiaoqing Wen
Department Of Information Engineering Mining College Akita University
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Han Yinhe
Key Laboratory Of Computer System And Architecture Institute Of Computing Technology Chinese Academy
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Li Xiaowei
Key Laboratory Of Computer System And Architecture Institute Of Computing Technology Chinese Academy Of Sciences
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