WEN Xiaoqing | Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology

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著作論文

Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time(Dependable Computing)
Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores(Dependable Computing)
On Detection of Bridge Defects with Stuck-at Tests
A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits
A Novel ATPG Method for Capture Power Reduction during Scan Testing(Dependable Computing)
A Per-Test Fault Diagnosis Method Based on the X-Fault Model(Dependable Computing)
A New Method for Low-Capture-Power Test Generation for Scan Testing(Dependable Computing)
On Design for I_-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies(Computer Components)

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