Reddy S | Univ. Iowa Usa
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概要
関連著者
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Reddy S
Univ. Iowa Usa
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Miyase K
Kyushu Institute Of Technology
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Miyase Kohei
Department Of Computer Sciences And Electronics Kyushu Institute Of Technology
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Miyase Kohei
Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology
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WEN Xiaoqing
Kyushu Institute of Technology
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WEN Xiaoqing
Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology
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梶原 誠司
九州工業大学:jst Crest
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KAJIHARA Seiji
Department of Computer Science and Electronics of Kyushu Institute of Technology
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梶原 誠司
九州工業大学情報工学部電子情報工学科:九州工業大学マイクロ化システムセンター
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梶原 誠司
九州工業大学情報工学部電子情報工学科:九州工業大学マイクロ化総合技術センタ
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Wen Xiaoqing
Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology
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Kajihara S
Kyushu Inst. Technol. Iizuka‐shi Jpn
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Kajihara Seiji
Faculty Of Engineering Osaka University
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POMERANZ Irith
School of Electrical and Computer Engineering, Purdue University
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KAJIHARA SEIJI
Center for Microelectronics Systems, Kyushu Institute of Technology
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REDDY SUDHARKAR
Electrical and Computer Engineering Department, University of Iowa
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MIYASE Kohei
Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology
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TERASHIMA Kenta
Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology
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REDDY Sudhakar
Department of Electrical and Computer Engineering, University of Iowa
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Kajihara Seiji
Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology
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Pomeranz Irith
School Of Electrical And Computer Engineering Purdue University
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TANIGUCHI Kenjiro
Department of Computer Sciences and Electronics, Kyushu Institute of Technology
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REDDY Sudhakar
Electrical and Computer Engineering Department, University of Iowa
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Xiaoqing Wen
Department Of Information Engineering Mining College Akita University
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Taniguchi Kenjiro
Department Of Computer Sciences And Electronics Kyushu Institute Of Technology
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Terashima Kenta
Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology
著作論文
- A Method of Static Test Compaction Based on Don't Care Identification (特集:システムLSIの設計技術と設計自動化)
- On Detection of Bridge Defects with Stuck-at Tests
- Don't Care Identification and Statistical Encoding for Test Data Compression(Test Generation and Compaction)(Test and Verification of VLSI)