A Method of Static Test Compaction Based on Don't Care Identification (特集:システムLSIの設計技術と設計自動化)

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概要

• 論文の詳細を見る

• In this paper, we propose a procedure to compact a test set for a combinational circuit. Given a test set in which all input values are specified, the procedure first identifies don't care inputs of the test set, and next reassigns appropriate values to the don't cares to achieve test compaction, where an incompatibility graph is constructed and a vertex coloring problem solved. The procedure can be applied repeatedly, until further compaction cannot be derived. Experimental results show effectiveness of the proposed procedure for the ISCAS benchmark circuits.

• 一般社団法人情報処理学会の論文
• 2002-05-15

著者

• Reddy S

  Univ. Iowa Usa

• Miyase Kohei

  Department Of Computer Sciences And Electronics Kyushu Institute Of Technology

• KAJIHARA SEIJI

  Center for Microelectronics Systems, Kyushu Institute of Technology

• REDDY SUDHARKAR

  Electrical and Computer Engineering Department, University of Iowa

関連論文

• A Method of Static Test Compaction Based on Don't Care Identification (特集:システムLSIの設計技術と設計自動化)
• On Detection of Bridge Defects with Stuck-at Tests
• Don't Care Identification and Statistical Encoding for Test Data Compression(Test Generation and Compaction)(Test and Verification of VLSI)
• Scan-Out Power Reduction for Logic BIST

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