Testing of k-FR Circuits under Highly Observable Condition
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概要
- 論文の詳細を見る
This paper presents the concept of k-FR circuits. The controllability of such a circuit is high due to its special structure. It is shown that all stuck-at faults and stuck-open faults in a k-FR circuit can be detected and located by k (k+1)+1 test vectors under the highly observable condition which assumes the output of every gate to be observable. k is usually two or three. This paper also presents an algorithm for converting an arbitrary combinational circuit into a k-FR circuit. A k-FR circuit is easy to test when using technologies such as the electron-beam probing, the current measurement, or the CrossCheck testability solution.
- 社団法人電子情報通信学会の論文
- 1995-07-25
著者
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WEN Xiaoqing
Kyushu Institute of Technology
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Kawano K
Okayama Univ. Okayama‐shi Jpn
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Tamamoto H
The Department Of Information Engineering Akita University
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Kawano K
Information Technology Center Okayama University
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Wen Xiaoqing
Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology
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Kinoshita K
Department Of Information Networking Graduate School Of Information Science And Technology Osaka Uni
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Kinoshita Kozo
Faculty Of Informatics Osaka Gakuin University
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Kinoshita Kozo
Faculty Of Engineering Osaka University
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TAMAMOTO Hideo
Department of Information Engineering, Akita University
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Xiaoqing Wen
Department of Information Engineering, Mining College, Akita University
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Xiaoqing Wen
Department Of Information Engineering Mining College Akita University
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