TEHRANIPOOR Mohammad | University of Connecticut
スポンサーリンク
概要
関連著者
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MIYASE Kohei
Kyushu Institute of Technology
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WEN Xiaoqing
Kyushu Institute of Technology
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FURUKAWA Hiroshi
Kyushu Institute of Technology
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YAMATO Yuta
Kyushu Institute of Technology
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KAJIHARA Seiji
Kyushu Institute of Technology
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GIRARD Patrick
LIRMM
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WANG Laung-Terng
SynTest
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TEHRANIPOOR Mohammad
University of Connecticut
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梶原 誠司
九州工業大学:jst Crest
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梶原 誠司
九州工業大学情報工学部電子情報工学科:九州工業大学マイクロ化システムセンター
著作論文
- High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme
- High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX : A Clock-Gating-Based Test Relaxation and X-Filling Scheme