Compaction of Test Vectors for IDDQ Testing of Sequential Circuits
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概要
著者
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Saluja Kewal
Department Of Electrical And Computer Engineering University Of Wisconsin-madison
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Saluja Kewal
Univ. Wisconsin‐madison Usa
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Takamatsu Y
Graduate School Of Science And Engineering Ehime University
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Higami Y
Graduate School Of Science And Engineering Ehime University
関連論文
- 組合せ回路および順序回路に対する診断用テスト圧縮法(LSIシステムの実装・モジュール化・インタフェース技術, テスト技術)
- 組合せ回路および順序回路に対する診断用テスト圧縮法(LSIシステムの実装・モジュール化・インタフェース技術, テスト技術)
- トランジスタ短絡故障モデルにおける等価故障解析について
- Addressing Defect Coverage through Generating Test Vectors for Transistor Defects
- Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors
- Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools
- On Finding Don't Cares in Test Sequences for Sequential Circuits(Dependable Computing)
- Generation of Test Sequences with Low Power Dissipation for Sequential Circuits(Test Generation and Compaction)(Test and Verification of VLSI)
- Problems and Solutions on IDDQ Testing
- Post-BIST Fault Diagnosis for Multiple Faults
- Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
- 完全故障検出効率を保証するレジスタ転送レベルデータパスの非スキャンテスト容易化設計法
- A Study of Capture-Safe Test Generation Flow for At-Speed Testing
- A Novel ATPG Method for Capture Power Reduction during Scan Testing(Dependable Computing)
- A Per-Test Fault Diagnosis Method Based on the X-Fault Model(Dependable Computing)
- A New Method for Low-Capture-Power Test Generation for Scan Testing(Dependable Computing)
- On Design for I_-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies(Computer Components)
- An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets(Test)(Dependable Computing)
- An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets
- Diagnosing Crosstalk Faults in Sequential Circuits Using Fault Simulation(Special Issue on Test and Verification of VLSI)
- Testing Core-Based System-on-a-Chip Designs
- Compaction of Test Vectors for IDDQ Testing of Sequential Circuits
- Transistor Leakage Fault Diagnosis for CMOS Circuits(Special Issue on Test and Diagnosis of VLSI)
- Transistor Leakage Fault Diagnosis with I_DDQ and Logic Information
- 順序回路のブリッジ故障に対するIDDQテストのための静的なテスト系列圧縮法 (テストと設計検証論文特集)
- 順序回路に対するIDDQテスト時間短縮について
- 順序回路に対するIDDQテスト時間短縮について
- 順序回路に対するIDDQテスト時間短縮について
- ランダムアクセススキャン : テスト時消費電力,テストデータ量,テスト時開削減法(VLSI設計とテスト)
- A Reduced Scan Shift Method for Sequential Circuit Testing (Special Section on VLSI Design and CAD Algorithms)
- Test Sequence Generation for Sequential Circuits with Distinguishing Sequences (Special Section on VLSI Design and CAD Algorithms)
- 完全故障検出効率を保証するレジスタ転送レベルデータパスの非スキャンテスト容易化設計法
- Design of C-Testable Modified-Booth Multipliers
- Diagnosing Delay Faults in Combinational Circuits under the Ambiguous Delay Model
- A Method of Generating Tests with Linearity Property for Gate Delay Faults in Combinational Circuits
- A Method of Test Generation for Iterative Logic Arrays (特集:VLSIプロセッサ及び新アーキテクチャLSI技術,一般)
- A Method of Test Generation for Iterative Logic Arrays (特集 VLSIプロセッサ及び新アーキテクスチャLSI技術、一般)
- A Method of Test Generation for Iterative Logic Arrays (特集:VLSIプロセッサ及び新アーキテクチャLSI技術,一般)
- Multiple Gate Delay Fault Diagnosis Using Test-Pairs for Marginal Delays(Special Issue on Test and Diagnosis of VLSI)
- Design of C-Testable Modified-Booth Multipliers Under the Stuck-at Fault Model
- Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool