Phase Transition Behavior of Ge–Bi–Te Thin Films from an NaCl to Rhombohedral Structure
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概要
- 論文の詳細を見る
The crystallization tendency and phase transition behavior of Ge–Bi–Te chalcogenide thin films were investigated with high-resolution transmission electron microscopy. The experimental results show that metastable NaCl changes occur in the stable rhombohedral structure through an intermediate structure with a monoclinic lattice and, secondly, that the motive force of such a phase transformation is the shearing distortion of the metastable structure along the $\langle 100\rangle$ direction.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2008-10-25
著者
-
Kim Yong
Semiconductor Devices Laboratory Korea Institute Of Science And Technology
-
Sun Chang
Department Of Chemistry And Pharmacy Jiamusi University
-
Lee Jeong
Department Of Anesthesiology And Pain Medicine Yonsei University College Of Medicine
-
Lee Jeong
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Republic of Korea
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Sun Chang
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Republic of Korea
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