Effects of Rapid Thermal Annealing on the Electrical Properties of Cobalt Contact to p-GaN

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概要

• 論文の詳細を見る
• Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
• 2001-07-15

著者

• Kim Yong

  Semiconductor Materials and Devices Lab, Korea Institute of Science and Technology

• Kim S

  Semiconductor Materials And Devices Laboratory Korea Institute Of Science And Technology

• Kim Seong-il

  Semiconductor Devices Laboratory Korea Institute Of Science And Technology

• Choi I‐h

  Department Of Materials Science Korea University

• Choi In-hoon

  Department Of Materials Science Korea University

• Kim J

  School Of Electrical Engineering Kobe University

• Kim Yong

  Semiconductor Devices Laboratory Korea Institute Of Science And Technology

• KIM Je

  School of Electrical Engineering, Kobe University

• KIM Sangsig

  School of Electrical Engineering, Korea University

• SUNG Man

  School of Electrical Engineering, Korea University

• Kim Yong

  Semiconductor Materials And Devices Laboratory Korea Institute Of Science And Technology

• Choi In-hoon

  Department Of Material Science Korea University

• Sung Man

  School Of Electrical Engineering Korea University

• Kim Je

  School Of Electrical Engineering Kobe University

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