Temperature effects on silicon-oxide-nitride-oxide-silicon transistors under channel hot electron injection operation (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))

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概要

• 論文の詳細を見る

• The temperature effects on SONOS transistors are investigated. In contrast to a conventional floating-gate memory cell with Fowler-Nordheim (FN) writing, the significant drain current (read current) and the leakage current increase is observed in Channel Hot Electron Injected (CHEI) programmed SONOS cell, which results in the read window narrowing at the high temperatures. The temperature effect is found to be correlated with locally trapped charge profile, whose relation with the read window narrowing.

• 社団法人電子情報通信学会の論文
• 2007-06-18

著者

• Park S‐h

  Magnachip Semiconductor Inc.

• Han In-Shik

  Dept. of Electronics Engineering, Chungnam National University

• Lee Hi-Deok

  Dept. of Electronics Engineering, Chungnam National University

• GOO Tae-Gyu

  Dept. of Electronics Engineering, Chungnam National University

• CHOI Won-Ho

  Dept. of Electronics Engineering, Chungnam National University

• LEE Ga-Won

  Dept. of Electronics Engineering, Chungnam National University

• LEE Heui-Seung

  Magnachip Semiconductor Inc.

• Joo Han-Soo

  Dept. of Electronic Engineering, Chungnam National University

• Park Sung-Soo

  Dept. of Electronic Engineering, Chungnam National University

• Yoo Ook-Sang

  Dept. of Electronic Engineering, Chungnam National University

• Om Jae-Chul

  Mobile & FLASH Division, Hynix Semiconductor Inc.

• Lee Seaung-Suk

  Mobile & FLASH Division, Hynix Semiconductor Inc.

• Bae Gi-Hyun

  Mobile & FLASH Division, Hynix Semiconductor Inc.

• Park Sung-soo

  Dept. Of Electronics Engineering Chungnam National University

• Lee H‐j

  Dept. Of Electronics Engineering Chungnam National University

• Lee Hi-deok

  R&d Division Lg Semicon Co. Ltd.

• Lee Hi-deok

  Dept. Of Electronics Engineering Chungnam National Univ.

• Lee Ga-won

  Dept. Of Electronics Engineering Chungnam National University

• Joo Han-soo

  Dept. Of Electronics Engineering Chungnam National University

• Bae Gi-hyun

  Mobile & Flash Division Hynix Semiconductor Inc.

• Choi Won-ho

  Dept. Of Electronics Engineering Chungnam National University

• Yoo Ook-sang

  Dept. Of Electronics Engineering Chungnam National University

• Lee Seaung-suk

  Mobile & Flash Division Hynix Semiconductor Inc.

• Om Jae-chul

  Mobile & Flash Division Hynix Semiconductor Inc.

• Park Seong-hyun

  Magnachip Semiconductor Inc.

• Lee H‐j

  Magnachip Semiconductor Inc.

• Han In-shik

  Dept. Of Electronics Engineering Chungnam National University

• Lee H‐d

  Chungnam National Univ. Taejon Kor

• Han In-shik

  Department Of Electronics Engineering Chungnam National University

• Park Si-ho

  Chebigen Inc. 350-b. Chungmugwan Sejong University

• Goo Tae-gyu

  Dept. Of Electronics Engineering Chungnam National University

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