New charge pumping method for characterization of charge trapping layer in oxide-nitride-oxide structure (Special issue: Solid state devices and materials)
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
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Park Sung-soo
Dept. Of Electronics Engineering Chungnam National University
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Choi Won-ho
Dept. Of Electronics Engineering Chungnam National University
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Han In-shik
Dept. Of Electronics Engineering Chungnam National University
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