Improvement of Current Injection Uniformity and Device Resistance in Long-Wavelength Vertical-Cavity Surface-Emitting Laser Using a Tunnel Junction
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-07-15
著者
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Koyama Fumio
Precision And Intelligence Laboratory Tokyo Institute Of Technology
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Koyama Fumio
Research Laboratory Of Precision Machinery And Electronics Tokyo Institute Of Technology
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MIYAMOTO Tomoyuki
Microsystem Research Center, Precision and Intelligence Laboratory, Tokyo Institute of Technology
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Iga Kenichi
Precision & Intelligence Lab., Tokyo Institute of Technology
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MIYAMOTO Tomoyuki
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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Miyamoto Takanori
Ntt Interdisciplinary Research Laboratories
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Kimura T
Photonics Research Institute National Institute Of Advanced Industrial Science And Technology
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OKAZAKI Gen
Microsystem Research Center, Precision and Intelligence Laboratory, Tokyo Institute of Technology
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SEKIGUCHI Shigeaki
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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KIMURA Tadayoshi
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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OKAZAKI Gen
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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Okazaki Gen
Microsystem Research Center Precision And Intelligence Laboratory Tokyo Institute Of Technology
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Miyamoto T
Tokyo Inst. Technol. Tokyo Jpn
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Kageyama Takeo
Microsystem Research Center Precision & Intelligence Laboratory Tokyo Institute Of Technology
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Shinada S
National Institute Of Information And Communications Technology
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Miura Toru
Microsystem Research Center P&i Laboratory Tokyo Institute Of Technology
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Koyama Fumio
Precision And Intelligence Laboratory Microsystem Research Center Tokyo Institute Of Technology
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Kimura Tatsumi
Photonics Research Institute National Institute Of Advanced Industrial Science And Technology
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Miyamoto Tomoyuki
Precision and Intelligence Lab, Tokyo Institute of Technology, Yokohama 226-8503, Japan
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