Thermal Stability of Interconnect of TiN/Cu/TiN Multilayered Structure
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1994-01-30
著者
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Nishikawa S
Mitsubishi Electric Corp. Hyogo Jpn
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NISHIKAWA Satoshi
Semiconductor Tech. Lab., Oki Electric Industry Co., Ltd.
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Yamaji Tetsuo
Semiconductor Technology Laboratory, Oki Electric Industry Co., Ltd.
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Nishikawa Satoshi
Semiconductor Tech. Lab. Oki Electric Industry Co. Ltd.
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Ito T
Osaka Univ. Osaka Jpn
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Yamaji T
Tokyo Denki Univ. Tokyo Jpn
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Yamaji Tetsuo
Semiconductor Technology Laboratory Oki Electric Industry Co. Ltd.
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YAMANOBE Tomomi
Semiconductor Tech. Lab., Oki Electric Industry Co., Ltd.
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Yamanobe T
Oki Electric Ind. Co. Ltd. Tokyo Jpn
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IGARASHI Yasushi
Semiconductor technology Laboratory, OKI Electric Industry Co., Ltd.
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ITO Toshio
Semiconductor technology Laboratory, OKI Electric Industry Co., Ltd.
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Igarashi Y
Semiconductor Tech.lab. Oki Electric Industry Co. Ltd.
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Igarashi Yasushi
Semiconductor Tech.Lab., Oki Electric Industry Co., Ltd.
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