Influence of Intrinsic Current Fluctuation in Very Small Si-MOSFETs

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概要

• 論文の詳細を見る
• 1999-09-20

著者

• 佐野 伸行

  筑波大学物理工学系

• 佐野 伸行

  筑波大 物理工学系

• SANO Nobuyuki

  Institute of Applied Physics, University of Tsukuba

• MATSUZAWA Kazuya

  Semiconductor Technology Academic Research Center(STARC)

• MUKAI Mikio

  Semiconductor Technology Academic Research Center(STARC)

• NATORI Kenji

  Institute of Applied Physics, University of Tsukuba

• Mukai Mikio

  Health-care Center Kinki Central Hospital

• Natori Kenji

  Institute Of Applied Physics University Of Tsukuba

• Natori K

  Univ. Tsukuba Ibaraki Jpn

• Matsuzawa Kazuya

  Semiconductor Technology Academic Research Center (starc)

• Matsuzawa Kazuya

  Advanced Lsi Technology Laboratory Research & Development Center Toshiba Corporation

• Matsuzawa Kazuya

  Semiconductor Technology Academic Research Center

• Matsuzawa K

  Toshiba Corp. Yokohama‐shi Jpn

• Sano Nobuyuki

  Institute Of Applied Physics The University Of Tsukuba

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