SANO Nobuyuki | Institute of Applied Physics, University of Tsukuba

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• SANO Nobuyukiの詳細を見る
• 同名の論文著者
• Institute of Applied Physics, University of Tsukubaの論文著者

関連著者

• SANO Nobuyuki

  Institute of Applied Physics, University of Tsukuba

• Sano Nobuyuki

  Institute Of Applied Physics The University Of Tsukuba

• NATORI Kenji

  Institute of Applied Physics, University of Tsukuba

• Natori Kenji

  Institute Of Applied Physics University Of Tsukuba

• 佐野 伸行

  筑波大学物理工学系

• MATSUZAWA Kazuya

  Semiconductor Technology Academic Research Center(STARC)

• Matsuzawa Kazuya

  Semiconductor Technology Academic Research Center (starc)

• Matsuzawa Kazuya

  Advanced Lsi Technology Laboratory Research & Development Center Toshiba Corporation

• Matsuzawa Kazuya

  Semiconductor Technology Academic Research Center

• Matsuzawa K

  Toshiba Corp. Yokohama‐shi Jpn

• 佐野 伸行

  筑波大 物理工学系

• MUKAI Mikio

  Semiconductor Technology Academic Research Center(STARC)

• Sano Nobuyuki

  Institute Of Applied Physics University Of Tsukuba

• Mukai Mikio

  Health-care Center Kinki Central Hospital

• Sano N

  Univ. Tsukuba Ibaraki Jpn

• NAKAYAMA Noriaki

  Semiconductor Technology Academic Research Center(STARC)

• Shimizu Tomo

  Institute Of Applied Physics University Of Tsukuba

• Natori K

  Univ. Tsukuba Ibaraki Jpn

• Nakayama Noriaki

  Semiconductor Technology Academic Research Center

• Nakayama Noriaki

  Fujitsu Laboratories Ltd.

• Nakayama Noriaki

  Semiconductor Technology Academic Research Center (starc)

• Nakayama Noriaki

  Department Of Advanced Materials Science And Engineering Faculty Of Engineering

• Sano Nobuyuki

  Univ. Tsukuba Ibaraki Jpn

• ISHIHARA Takamitsu

  Advanced LSI Technology Laboratory, Research and Development Center, Toshiba Corporation

• Kusaka Hiroyuki

  Institute Of Applied Physics University Of Tsukuba

• TOMIZAWA Masaaki

  NTT LSI Laboratories

• HIROKI Akira

  Semiconductor Technology Academic Research Center (STARC)

• Uehara Tsuyoshi

  Institute Of Applied Physics University Of Tsukuba

• TORIYAMA Shuichi

  Advanced LSI Technology Laboratory, Toshiba Corporation

• Toriyama Shuichi

  Advanced Lsi Technology Laboratory Toshiba Corporation

• Tomizawa Masaaki

  Ntt Lifestyle And Environmental Technology Labs

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著作論文

• Influence of Thermal Noise on Drain Current in Very Small Si-MOSFETs
• Influence of Intrinsic Current Fluctuation in Very Small Si-MOSFETs
• Current Fluctuation Characteristic of Sub-0.1 Micron Device Structures:A Monte Carlo Study
• Coulomb and Phonon Scattering Processes in Metal-Oxide-Semiconductor Inversion Layers : Beyond Matthiessen's Rule
• Minimum Value of the Specific Contact Resistance of Si-Metal Contacts : The Origin and the Magnitude
• Transport Characteristics of the Cross Junction of Atomic Chains
• Probability Distribution of Threshold Voltage Fluctuations in Metal-OXide-Semiconductor Field-Effect-Transistors : Semiconductors
• A Monte Carlo Study of Current-Voltage Characteristics of the Scaled-Down single-Electron Transistor with a Silicon Rectangular Parallelepiped Quantum Dot
• Detailed Balance in Quasi-Ballistic Electron Transport under Nanoscale Device Structures
• Schottky Barrier MOSFETs as Resonant Tunneling Devices
• The Resonant Tunneling Mode of a Single Electron Transistor
• Statistical Threshold Fluctuations in Si-MOSFETs : Jellium vs. Atomistic Dopant Variations

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