Structural Characterization of Thick GaN Films Grown on Free-Standing GaN Seeds by the Ammonothermal Method Using Basic Ammonia

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概要

• 論文の詳細を見る
• 2005-07-10

著者

• Nakamura Shuji

  Materials Department University Of California

• Speck James

  Materials Department University Of California

• WU Feng

  Materials Department, University of California

• Speck J

  Univ. California California Usa

• Heying Benjamin

  Solid State Lighting And Display Center University Of California

• Wu Feng

  Materials Department University Of California

• FINI Paul

  Materiais and Electrical and Computer Engineering, University of Callfornia

• HASKELL Benjamin

  Materials Departments, University of California

• Speck James

  Erato/jst Ucsb Group

• Fini Paul

  Materials Department And Erato/jst Ucsb Group University Of California

• Heying B.

  Solid State Lighting And Display Center University Of California

• Haskell Benjamin

  Materials Departments University Of California

• HASHIMOTO Tadao

  Materials Department and ERATO/JST UCSB group, University of California

• FUJITO Kenji

  Materials Department and ERATO/JST UCSB Group, University of California

• Wu F

  米国

• Fujito Kenji

  Materials Department And Erato/jst Ucsb Group University Of California

• Hashimoto Tadao

  Materials Department And Erato/jst Ucsb Group University Of California

• Nakamura Shuji

  Materials Department University Of Cahfornia

• Speck James

  Materials Department And Erato/jst Ucsb Group University Of California

• Wu Feng

  Materials Department University Of California Santa Barbara

• Wu Feng

  Materials Department and NICP ERATO/JST Group, University of California, Santa Barbara, CA 93106, U.S.A.

• SPECK J.

  Materials Department, University of California, Santa Barbara

• Speck James

  Materials Department and Electrical and Computer Engineering Department, University of California, Santa Barbara, CA 93106, U.S.A.

• Haskell Benjamin

  Materials Department, Electrical and Computer Engineering Department, and NICP/ERATO JST UCSB Group, University of California, Santa Barbara, CA 93106-5050, U.S.A.

• Fujino Kenji

  Optoelectronic Laboratory, Mitsubishi Chemical Corporation

• Fujino Kenji

  Materials Department and ERATO/JST UCSB Group, University of California

• Wu Feng

  Materials Department and ERATO/JST UCSB Group, University of California, Santa Barbara, CA 93106-5050, U.S.A.

• Haskell Benjamin

  Materials Department and ERATO/JST UCSB Group, University of California, Santa Barbara, CA 93106-5050, U.S.A.

• Speck James

  Materials and Electrical Engineering Departments, University of California, Santa Barbara, CA 93106, U.S.A.

関連論文

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