Photoinduced Effects on Single-Charge Tunneling in a Si Two-Dimensional Multidot Field-Effect Transistor
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概要
- 論文の詳細を見る
- Japan Society of Applied Physicsの論文
- 2004-06-15
著者
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Ikeda Hiroya
Research Institute Of Electronics Shizuoka University
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TABE Michiharu
Research Institute of Electronics, Shizuoka University
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Nuryadi Ratno
Research Institute of Electronics, Shizuoka University
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ISHIKAWA Yasuhiko
Research Institute of Electronics, Shizuoka University
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石川 靖彦
Research Institute Of Electronics Shizuoka University
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- Fowler-Nordheim Current Oscillations in Si(111)/SiO_2/Twisted-Si(111) Tunneling Structures
- Current fluctuation in single-hole transport through a two-dimensional Si multidot
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