Fowler–Nordheim Current Oscillations in Si(111)/SiO2/Twisted-Si(111) Tunneling Structures

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概要

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• The dependence of Fowler–Nordheim current oscillations (FNCOs) on the twist angle between the facing Si layers in Si(111)/SiO2/Si(111) bonded structures is investigated. The observed systematic variation in oscillation amplitude with twist angle can be ascribed to transverse momentum conservation upon Fowler–Nordheim tunneling through thin SiO2. A calculation result, taking into account the twist-induced decrease in potential discontinuity and consequently in the reflection coefficient at the SiO2/twisted Si interface, provides the theoretical basis for the experimental results.

• INSTITUTE OF PURE AND APPLIED PHYSICSの論文
• 2006-03-25

著者

• Ikeda Hiroya

  Research Institute Of Electronics Shizuoka University

• MORARU Daniel

  Research Institute of Electronics, Shizuoka University

• KATO Hiroshi

  Research Institute of Electronics, Shizuoka University

• Tabe Michiharu

  Research Institue Of Electronics Shizuoka University

• Ishikawa Yasuhiko

  Research Center For Interface Quantum Electronics And Graduate School Of Electronics And Information

• Horiguchi Seiji

  Department Of Electrical And Electronic Engineering Akita University

• Ikeda Hiroya

  Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu, Shizuoka 432-8011, Japan

• Tabe Michiharu

  Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu, Shizuoka 432-8011, Japan

• Moraru Daniel

  Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu, Shizuoka 432-8011, Japan

• Horiguchi Seiji

  Department of Electrical and Electronic Engineering, Akita University, 1-1 Tegata-Gakuen-machi, Akita 010-8502, Japan

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