Photoinduced Effects on Single-Charge Tunneling in a Si Two-Dimensional Multidot Field-Effect Transistor
スポンサーリンク
概要
- 論文の詳細を見る
We have investigated the effect of illumination on the Coulomb blockade (CB) characteristics of Si two-dimensional multidot field-effect transistors. Some of the transistors exhibit remarkable changes in their CB characteristics for single-hole tunneling as a results of illumination, i.e., the generation of a new Coulomb oscillation peak and/or a shift in gate voltage. The photoinduced phenomena can be explained by a model in which the illumination supplies an additional electron to a dot adjacent to the CB current percolation path. A Monte Carlo simulation of an equivalent circuit based on the above model can reproduce the experimental characteristics.
- 2004-06-15
著者
-
Ikeda Hiroya
Research Institute Of Electronics Shizuoka University
-
Tabe Michiharu
Research Institue Of Electronics Shizuoka University
-
Nuryadi Ratno
Research Institue Of Electronics Shizuoka University
-
Ishikawa Yasuhiko
Research Center For Interface Quantum Electronics And Graduate School Of Electronics And Information
-
Nuryadi Ratno
Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu 432-8011, Japan
-
Ikeda Hiroya
Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu 432-8011, Japan
関連論文
- Design of dopant-induced quantum dot arrays in silicon nanostructures for single-electron transfer (シリコン材料・デバイス)
- Design of dopant-induced quantum dot arrays in silicon nanostructures for single-electron transfer (電子デバイス)
- Single-electron transfer in phosphorous-doped Si nanowire FETs
- Time-controlled single-electron transfer in single-gated asymmetric multiple tunnel junction arrays
- Tunneling current oscillations in Si/SiO_2/Si structures(結晶成長評価及びデバイス(化合物,Si,SiGe,その他の電子材料))
- Tunneling current oscillations in Si/SiO_2/Si structures(結晶成長評価及びデバイス(化合物,Si, SiGe,その他の電子材料))
- Fowler-Nordheim Current Oscillations in Si(111)/SiO_2/Twisted-Si(111) Tunneling Structures
- Formation of Nanometer-Scale Dislocation Network Sandwiched by Silicon-on-Insulator Layers
- Charge polarization effect on single-hole-characteristics in a two-dimensional Si multidot structure
- Photoinduced Effects on Single-Charge Tunneling in a Si Two-Dimensional Multidot Field-Effect Transistor
- Ambipolar Coulomb Blockade Characteristics in a Two-Dimensional Si Multidot Device
- Resonant tunneling characteristics in SiO₂/Si double-barrier structures in a wide range of applied voltage
- Artificial Dislocation Network in Silicon-on-Insulator Layer for Single-Electron Devices
- Seebeck Coefficient of Ultrathin Silicon-on-Insulator Layers
- Tunneling current oscillations in Si/SiO_2/Si structures(結晶成長評価及びデバイス(化合物,Si, SiGe,その他の電子材料))
- Time-controlled single-electron transfer in single-gated asymmetric multiple tunnel junction arrays
- Time-controlled single-electron transfer in single-gated asymmetric multiple tunnel junction arrays
- Quantum-Confinement Effect in Ultrathin Si Layer of Silicon-on-Insulator Substrate : Semiconductors
- Single-Electron Transfer by Inter-Dopant Coupling Tuning in Doped Nanowire Silicon-on-Insulator Field-Effect Transistors
- Dopant ionization in silicon nanodevices investigated by Kelvin Probe Force Microscope (シリコン材料・デバイス)
- Dopant ionization in silicon nanodevices investigated by Kelvin Probe Force Microscope (電子デバイス)
- Photo-illumination effects on the Si multiple-tunnel-junction single-hole devices
- Thermal Nitridation of Si(111) Surfaces with N_2 Molecules Studied by X-Ray Photoelectron Spectroscopy
- Scanning Tunneling Microscope Study of (001)InP Surface Prepared by Gas Source Molecular Beam Epitaxy
- In-Situ Contactless Characterization of Microscopic and Macroscopic Properties of Si-doped MBE-Grown (2×4) GaAs Surfaces
- In-Situ Contactless Characterization of Microscopic and Macroscopic Properties of Si-Doped MBE-Grown (2x4) GaAs Surfaces
- Fabrication and Electrical Characteristics of Silicon Quantum Dot Devices
- Light irradiation effect on single-hole-tunneling current of an SOI-FET(結晶成長評価及びデバイス(化合物,Si, SiGe,その他の電子材料))
- Photon irradiation effects on Si multiple-tunnel-junction field-effect transistors : Sensing the presence of a single-charge in the substrate
- Photon irradiation effects on Si multiple-tunnel-junction field-effect transistors : Sensing the presence of a single-charge in the substrate
- Capacitance-Voltage Study of Silicon-on-Insulator Structure with an Ultrathin Buried SiO_2 Layer Fabricated by Wafer Bonding
- Effects of Electron Tunneling into a Single-Crystalline Si Layer through an Ultrathin Buried Oxide
- In-Situ Scanning Tunneling Microscope Study of Formation Process of Ultrathin Si Layer by Molecular Beam Epitaxy on GaAs(001)-(2×4) Surface
- In-Situ UHV-STM Study of Formation Process of Ultrathin MBE Si Layer on GaAs(001)-(2x4) Surface
- Missing-Dimer Structures and Their Kink Defects on Molecular Beam Epitaxially Grown (2×4) Reconstructed (001) InP and GaAs Surfaces Studied by Ultrahigh-Vacuum Scanning Tunneling Microscopy
- Missing-Dimer Structures and Their Kink Defects on MBE-Grown (2x4) Reconstructed (001)Inp Surfaces Studied by UHV Scanning Tunneling Microscope
- Si Pillar Formation and Height Countrol by Furnace Oxidation of the Si (111) Surface with Ultra-Small SiN Nuclei
- Si Pillar Formation and Height Control by Furnace Oxidation of the Si (111) Surface with Ultra-Small SiN Nuclei
- Photon irradiation effects on Si multiple-tunnel-junction field-effect transistors : Sensing the presence of a single-charge in the substrate
- Nanometer-Scale Local Oxidation of Si Using SiN Islands Formed in the Early Stages of Nitridation
- Multi-Charge Turnstile Operation in Random-Multidot Channel FET
- Light irradiation effect on single-hole-tunneling current of an SOI-FET(結晶成長評価及びデバイス(化合物,Si,SiGe,その他の電子材料))
- Light irradiation effect on single-hole-tunneling current of an SOI-FET(結晶成長評価及びデバイス(化合物,Si, SiGe,その他の電子材料))
- Thermal Agglomeration of Ultrathin Si Layer on Buried SiO_2
- Thermally-Induced Structural Changes of Ultrathin Silicon-on-Insulator Structure
- Simulation of Visible Light Induced Effects in a Tunnel Junction Array for Photonic Device Applications
- Resonant Tunneling Effect in Si/SiO_2 Double Barrier Structure
- Single-Electron Charging in Phosphorus Donors in Silicon Observed by Low-Temperature Kelvin Probe Force Microscope
- Photoirradiation Effects in a Single-Electron Tunnel Junction Array (Special Issue on Technology Challenges for Single Electron Devices)
- Photo-Irradiation Effects in Single-Electron Tunnel Junction Arrays
- Simulations of Relaxation Processes for Non-Equilibrium Electron Distributions in Two-Dimensional Tunnel Junction Arrays ( Quantum Dot Structures)
- Fabrication of CoSi2-Buried-Metal-Layer Si Substrates for Infrared Reflection Absorption Spectroscopy by Wafer-Bonding
- Photoinduced Effects on Single-Charge Tunneling in a Si Two-Dimensional Multidot Field-Effect Transistor
- A Theoretical Study of a Novel Single-Electron Refrigerator Fabricated from Semiconductor Materials
- Theoretical Study on the Stability of the Single-Electron-Pump Refrigerator with Respect to Thermal and Dimensional Fluctuations
- Thermal Agglomeration of Ultrathin Silicon-on-Insulator Layers: Crystalline Orientation Dependence
- Concentration of Electric Field near Si Dot/Thermally-Grown SiO2 Interface
- Single-Gated Single-Electron Transfer in Nonuniform Arrays of Quantum Dots
- Fowler–Nordheim Current Oscillations in Si(111)/SiO2/Twisted-Si(111) Tunneling Structures
- Photon-Induced Random Telegraph Signal Due to Potential Fluctuation of a Single Donor-Acceptor Pair in Nanoscale Si p-n Junctions
- The dissolution process of Si into Ge melt and SiGe growth mechanism by X-ray penetration method
- The dissolution process of Si into Ge melt and SiGe growth mechanism by X-ray penetration method
- The dissolution process of Si into Ge melt and SiGe growth mechanism by X-ray penetration method
- Theoretical Study on the Stability of the Single-Electron-Pump Refrigerator with Respect to Thermal and Dimensional Fluctuations