Scanning Tunneling Microscopy of (NH_4)_2S_x-Treated GaAs Surfaces Annealed in Vacuum
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1994-03-01
著者
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Inoue N
National Defense Acad. Yokosuka Jpn
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Inoue N
Oki Electric Ind. Co. Ltd. Tokyo Jpn
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Shinohara Masanori
NTT Atsugi Electrical Communication Laboratories
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Shinohara Masanori
Ntt Lsi Laboratories
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Inoue Naohisa
Ntt Lsi Laboratories
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Yokoyama H
Electrotechnical Lab. Ibaraki Jpn
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Shinohara M
Shimadzu Corporation
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TANIMOTO Masafumi
NTT LSI Laboratories
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YOKOYAMA Haruki
NTT LSI Laboratories
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Shinohara M
Surface Analysis And Semiconductor Equipment Department Shimadzu Corporation
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Tanimoto M
Ntt Lsi Laboratories
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