TANIMOTO Masafumi | NTT LSI Laboratories
スポンサーリンク
概要
関連著者
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TANIMOTO Masafumi
NTT LSI Laboratories
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Shinohara Masanori
Ntt Lsi Laboratories
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Tanimoto M
Ntt Lsi Laboratories
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Inoue N
National Defense Acad. Yokosuka Jpn
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Inoue N
Oki Electric Ind. Co. Ltd. Tokyo Jpn
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Shinohara Masanori
NTT Atsugi Electrical Communication Laboratories
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Inoue Naohisa
Ntt Lsi Laboratories
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Shinohara M
Shimadzu Corporation
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Shinohara M
Surface Analysis And Semiconductor Equipment Department Shimadzu Corporation
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Kanisawa Kiyoshi
Ntt Basic Research Laboratories
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KANISAWA Kiyoshi
NTT Basic Research Laboratories, NTT Corporation
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Yokoyama H
Electrotechnical Lab. Ibaraki Jpn
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YOKOYAMA Haruki
NTT LSI Laboratories
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Kanisawa K
Ntt Basic Research Laboratories
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FURUTA Tomofumi
NTT LSI Laboratories
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DOUSEKI Takakuni
NTT LSI Laboratories
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Kanisawa Kiyoshi
NTT LSI Laboratories
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KURIYAMA Yoichi
NTT Atsugi Electrical Communications Laboratories
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SUGIYAMA Hiroki
NTT LSI Laboratories
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TAKIGAMI Takako
NTT LSI Laboratories
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KURIYAMA Youichi
NTT LSI Laboratories
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Murashita Tooru
Ntt Lsi Laboratories
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Tanimoto M
Ntt Sci. And Core Technol. Lab. Group Kanagawa Jpn
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Tanimoto Masafumi
NTT LSI Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 234-01, Japan
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Kanisawa Kiyoshi
NTT Basic Research Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 234-01, Japan
著作論文
- Fabrication of Rectangular Holes along 2×4 Unit Cells on GaAs(001) Reconstructed Surface with a Scanning Tunneling Microscope
- Growth Processes of GaAs Grown by Atomic Layer Epitaxy Revealed by Atomic Force Microscopy
- Scanning Tunneling Microscopy of (NH_4)_2S_x-Treated GaAs Surfaces Annealed in Vacuum
- Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy
- Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy
- Analysis of P^+ -n Junction Capacitance with Three-Dimensional Impurity Profiling Method Using Scanning Tunneling Microscopy
- Scanning Tunneling Microscopy of Cleaved Si and GaAs Surfaces in Air
- Quantum Interferometric Spectroscopy: A Novel Technique for Nanometer-Scale Characterization of Heterostructures
- Observation of Tunneling Electron Luminescence at Low Temperatures Using Novel Conductive Transparent Tip
- Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy