Shinohara Masanori | Ntt Lsi Laboratories
スポンサーリンク
概要
関連著者
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Shinohara Masanori
Ntt Lsi Laboratories
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TANIMOTO Masafumi
NTT LSI Laboratories
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Inoue Naohisa
Ntt Lsi Laboratories
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Inoue N
National Defense Acad. Yokosuka Jpn
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Inoue N
Oki Electric Ind. Co. Ltd. Tokyo Jpn
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Shinohara Masanori
NTT Atsugi Electrical Communication Laboratories
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Shinohara M
Shimadzu Corporation
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Shinohara M
Surface Analysis And Semiconductor Equipment Department Shimadzu Corporation
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Kanisawa Kiyoshi
Ntt Basic Research Laboratories
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Tanimoto M
Ntt Lsi Laboratories
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KANISAWA Kiyoshi
NTT Basic Research Laboratories, NTT Corporation
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Yokoyama H
Electrotechnical Lab. Ibaraki Jpn
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YOKOYAMA Haruki
NTT LSI Laboratories
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Kanisawa K
Ntt Basic Research Laboratories
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Sakai Masamichi
Institute for Materials Research, Tohoku University
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Sakai Masamichi
Institute Of Materials Research Tohoku University
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Imamura Yoshihiro
Ntt Lsi Laboratories
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Ikuta Kenji
Ntt Lsi Laboratories
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SUGIYAMA Hiroki
NTT LSI Laboratories
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Yanagawa Fumihiko
Ntt Lsi Laboratories
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Tanimoto Masafumi
NTT LSI Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 234-01, Japan
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Kanisawa Kiyoshi
NTT Basic Research Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 234-01, Japan
著作論文
- Fabrication of Rectangular Holes along 2×4 Unit Cells on GaAs(001) Reconstructed Surface with a Scanning Tunneling Microscope
- Growth Processes of GaAs Grown by Atomic Layer Epitaxy Revealed by Atomic Force Microscopy
- Scanning Tunneling Microscopy of (NH_4)_2S_x-Treated GaAs Surfaces Annealed in Vacuum
- Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy
- Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy
- Growth Properties of Al_xGa_As Grown by MOVPE Using TEG and TMA
- Interface Structures in AlGaAs/GaAs Quantum Wells Grown by Metalorganic Chemical Vapor Deposition (MOCVD)
- Influence of Carrier Scattering on Franz-Keldysh Effect in Near-Surface Region of n-Type GaAs
- Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy