Carrier-Induced Energy-Gap Shrinkage in Current-Injection GaAs/AlGaAs MQW Heterostructures
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1984-07-20
著者
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Tarucha S
Ntt Basic Res. Lab. Kanagawa Jpn
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TARUCHA Seigo
Musashino Electrical Communication Laboratory,NTT
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OKAMOTO Hiroshi
Musashino Electrical Communication Laboratory,NTT
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Tarucha Seigo
Ntt Basic Research Laboratories Ntt Corporation
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Okamoto H
Department Of Systems Innovation Graduate School Of Engineering Science Osaka University
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HORIKOSHI Yoshiji
NTT Electrical Communications Laboratories
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HORIKOSHI Yoshiji
Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Corporation
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Tarucha Seigo
Ntt Basic Research Laboratories:department Of Physics University Of Tokyo
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Tarucha Seigo
Ntt Electrical Communications Laboratories
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Kobayashi Hideki
Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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Tarucha Seigo
Musashino Electrical Communication Laboratory Ntt
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Okamaoto H
Laboratory Of Cardiovascular Pharmacology Department Of Biopharmaceutical Sciences Kobe Gakuin Unive
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Okamoto H
Department Of Systems And Control Engineering Anan National College Of Technology
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Tarucha S
Ntt Basic Research Laboratories Ntt Corporation
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Horikoshi Yoshiji
Musashino Electric Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Okamoto Hiroshi
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Kobayashi Hideki
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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