Self-Aligned Metal Source/Drain InxGa1-xAs n-Metal--Oxide--Semiconductor Field-Effect Transistors Using Ni--InGaAs Alloy
スポンサーリンク
概要
- 論文の詳細を見る
We report that a Ni--InGaAs alloy can be used as a source/drain (S/D) metal for InGaAs metal--oxide--semiconductor field-effect transistors (MOSFETs), allowing us to employ the salicide-like self-align S/D formation. We also introduce Schottky barrier height (SBH) engineering process by increasing the indium content of InxGa1-xAs channels, which successfully reduces SBH down to zero. We propose a fabrication process for self-aligned metal S/D MOSFETs using Ni--InGaAs and demonstrate successful operation of the metal S/D InxGa1-xAs MOSFETs. The In0.7Ga0.3As MOSFETs exhibit an S/D resistance ($R_{\text{SD}}$) that is 1/5 lower than that in P--N junction devices and a high peak mobility of 2000 cm2 V-1 s-1.
- 2011-02-25
著者
-
Yamada Hisashi
Sumitomo Chemical
-
MIYATA Noriyuki
National Institute of Advanced Industrial Science and Technology (AIST)
-
URABE Yuji
National Institute of Advanced Industrial Science and Technology (AIST)
-
Nakane Ryosho
Department Of Electrical Engineering And Information Systems The University Of Tokyo
-
Fukuhara Noboru
Sumitomo Chemical
-
Hata Masahiko
Sumitomo Chemical
-
Takenaka Mitsuru
Department Of Electrical Engineering And Information Systems School Of Engineering The University Of
-
Lee Sunghoon
Department Of Management Systems Engineering
-
Yasuda Tetsuji
National Institute Of Advanced Industrial Science And Technology
-
Yokoyama Masafumi
Department Of Electrical Engineering And Information Systems The University Of Tokyo
-
Takagi Shinichi
Department Of Electrical Engineering And Information Systems The University Of Tokyo
-
KIM SangHyeon
Department of Electrical Engineering and Information Systems, The University of Tokyo
-
TAOKA Noriyuki
Department of Electrical Engineering and Information Systems, The University of Tokyo
-
IIDA Ryo
Department of Electrical Engineering and Information Systems, The University of Tokyo
-
Iida Ryo
Department Of Electrical Engineering And Information Systems The University Of Tokyo
-
Kim Sanghyeon
Department Of Electrical Engineering And Information Systems The University Of Tokyo
-
Miyata Noriyuki
National Institute Of Advanced Industrial Science And Technology
-
Urabe Yuji
National Institute Of Advanced Industrial Science And Technology
-
Taoka Noriyuki
Department Of Electrical Engineering And Information Systems The University Of Tokyo
-
LEE Sunghoon
Department of Electrical Engineering and Information Systems, The University of Tokyo
-
Taoka Noriyuki
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
-
Yasuda Tetsuji
National Institute for Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan
関連論文
- Kelvin Probe Study of Dipole Formation and Annihilation at the HfO_2/Si Interface
- Thin Body III-V-Semiconductor-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors on Si Fabricated Using Direct Wafer Bonding
- InGaAsP Photonic Wire Based Ultrasmall Arrayed Waveguide Grating Multiplexer on Si Wafer
- High Electron Mobility Metal-Insulator-Semiconductor Field-Effect Transistors Fabricated on (111)-Oriented InGaAs Channels
- Dislocation-Free InGaAs on Si(111) Using Micro-Channel Selective-Area Metalorganic Vapor Phase Epitaxy
- A New Spin-Functional Metal-Oxide-Semiconductor Field-Effect Transistor Based on Magnetic Tunnel Junction Technology : Pseudo-Spin-MOSFET
- The effect of n-GaAs carrier concentration on current gain in InGaP/GaAs heterojunction bipolar transistors
- Influence of 5/3 Ratio of Carbon-Doped p-GaAs on Current Gain and Its Thermal Stability in InGaP/GaAs HeterdunctionBipolmTransistors
- Waveguide-Based 1.5μm Optical Isolator Based on Magneto-Optic Effect in Ferromagnetic MnAs
- Demonstration of All-Optical Wavelength Converter Based on Fabry-Perot Semiconductor Optical Amplifier
- Effect of Interface Oxidation on the Electrical Characteristics of HfO_2/Ultrathin-Epitaxial-Ge/GaAs(100) Structures
- High Performance Ultrathin (110)-Oriented Ge-on-Insulator p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors Fabricated by Ge Condensation Technique
- Physical Origin of Drive Current Enhancement in Ultrathin Ge-on-Insulator n-Channel Metal--Oxide--Semiconductor Field-Effect Transistors under Full Ballistic Transport
- Interface-Controlled Self-Align Source/Drain Ge p-Channel Metal--Oxide--Semiconductor Field-Effect Transistors Fabricated Using Thermally Oxidized GeO2 Interfacial Layers
- High-Temperature Annealing Effect of Si in Group-V Ambient Prior to Heteroepitaxy of InAs in Metal--Organic Vapor Phase Epitaxy
- Gas Phase Doping of Arsenic into (100), (110), and (111) Germanium Substrates Using a Metal--Organic Source
- Influences of Supplementary Dietary Tungsten on Methionine Metabolism in Rabbits Fed a Low-Cholesterol plus Methionine Diet
- GaInAsP/InP Directional Coupler Loaded with Grating for Optically-Controlled Switching(Special Issue on Recent Progress of Integrated Photonic Devices)
- Physiology of Human Cortical Neurons Adjacent to Cavernous Malformations and Tumors
- Dependences of Initial Nucleation on Growth Conditions of InAs on Si by Micro-Channel Selective-Area Metal–Organic Vapor Phase Epitaxy
- Ultrathin Body InGaAs-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors with InP Passivation Layers on Si Substrates Fabricated by Direct Wafer Bonding
- Portfolio by using Time-series Analysis and Portfolio Insurance(ABSTRACTS OF PROCEEDINGS OF THE SCHOOL OF INFORMATION TECHNOLOGY AND ELECTRONICS SERIES J TOKAI UNIVERSITY -2003-2004-)
- Impact of cation surface termination on the electrical characteristics of HfO2/InGaAs(001) metal-oxide-semiconductor capacitors (Special issue: Dielectric thin films for future electron devices: science and technology)
- Preparation and electrical characterization of CeO2 films for gate dielectrics application: comparative study of chemical vapor deposition and atomic layer deposition processes (Special issue: Dielectric thin films for future electron devices: science and
- ??/Ge High Mobility Channel Integration of InGaAs n-Channel and Ge p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors with Self-Aligned Ni-Based Metal Source/Drain Using Direct Wafer Bonding
- Investigation of InAlAs Oxide/InP Metal–Oxide–Semiconductor Structures Formed by Wet Thermal Oxidation
- Characterization of Ni-GaSb Alloys Formed by Direct Reaction of Ni with GaSb
- Electron Mobility Enhancement of Extremely Thin Body In_Ga_As-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors on Si Substrates by Metal-Oxide-Semiconductor Interface Buffer Layers
- Electron Mobility Degradation and Interface Dipole Formation in Direct-Contact HfO_2/Si Metal-Oxide-Semiconductor Field-Effect Transistors
- Self-Aligned Metal Source/Drain InxGa1-xAs n-Metal--Oxide--Semiconductor Field-Effect Transistors Using Ni--InGaAs Alloy
- Effects of Light Exposure during Plasma Processing on Electrical Properties of GeO2/Ge Structures
- III-V/Ge High Mobility Channel Integration of InGaAs n-Channel and Ge p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors with Self-Aligned Ni-Based Metal Source/Drain Using Direct Wafer Bonding
- Controlling Anion Composition at Metal--Insulator--Semiconductor Interfaces on III--V Channels by Plasma Processing
- Characterization of Ni--GaSb Alloys Formed by Direct Reaction of Ni with GaSb
- Characterization of Ni-GaSb Alloys Formed by Direct Reaction of Ni with GaSb
- Analysis of Microstructures in SiGe Buffer Layers on Silicon-on-Insulator Substrates
- Tunneling Magnetoresistance in a Mn $\delta$-doped GaAs/AlAs/MnAs Heterostructure
- Influence of V/III Ratio of Carbon-Doped p-GaAs on Current Gain and Its Thermal Stability in InGaP/GaAs Heterojunction Bipolar Transistors
- In-Plane Uniaxial Magnetic Anisotropy of [(InyGa1-y)1-xMnx]As Characterized by Planar Hall Effect
- Impacts of Surface Roughness Reduction in (110) Si Substrates Fabricated by High-Temperature Annealing on Electron Mobility in n-Channel Metal--Oxide--Semiconductor Field-Effect Transistors on (110) Si
- Impact of Cation Surface Termination on the Electrical Characteristics of HfO2/InGaAs(001) Metal--Oxide--Semiconductor Capacitors
- Reduction in Interface Trap Density of Al
- InGaAsP Grating Couplers Fabricated Using Complementary-Metal--Oxide--Semiconductor-Compatible III--V-on-Insulator on Si
- Characterization of Monolayer Oxide Formation Processes on High-Index Si Surfaces by Photoelectron Spectroscopy with Synchrotron Radiation
- Impacts of Surface Roughness Reduction in (110) Si Substrates Fabricated by High-Temperature Annealing on Electron Mobility in n-Channel Metal-Oxide-Semiconductor Field-Effect Transistors on (110) Si (Special Issue : Solid State Devices and Materials)