Analysis of the Dark-Current Density in Solar Cells Based on Multicrystalline SiGe
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概要
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We analyzed the dark-current density obtained from solar cells based on multicrystalline SiGe (mc-SiGe) using a modified two-diode model that includes two diodes with diode ideality factors of 1 and 2, shunt resistance, and several series resistances. The ratio of recombination area $r$, which corresponds to the domination of recombination current, is almost independent of the average Ge composition, while the shunt resistance $R_{\text{sh}}$ shows little change up to 5% and a drastic reduction at an average Ge composition of 10%. These results indicate that the deterioration of solar cell properties with an average Ge composition of 10% is mainly due to its lower shunt resistance, which is caused by the generation of defects. It can also be said that the quality of mc-SiGe is preserved at an average Ge composition of up to 5%. This strongly supports the suitability to high-efficient solar cells of mc-SiGe that has the proper average Ge composition due to its enhanced absorption coefficient and the resultant increase in short-circuit current density.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-11-15
著者
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Usami Noritaka
Institute For Material Research Tohoku University
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Pan Wugen
Institute For Materials Research (imr) Tohoku University
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Fujiwara Kozo
Institute For Materials Research (imr) Tohoku University
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Ohdaira Keisuke
Institute For Materials Research (imr) Tohoku University
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Usami Noritaka
Institute for Materials Research (IMR), Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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Nakajima Kazuo
Institute for Materials Research (IMR), Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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Nakajima Kazuo
Institute for Materials Reseach, Tohoku University, 2-1-1 Katahira-cho, Aoba-ku, Sendai 980-8577, Japan
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