Investigation of a High Quality and Ultraviolet-Light Transparent Plasma-Enhanced Chemical Vapor Deposition Silicon Nitride Film for Non-Volatile Memory Application
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1995-09-15
著者
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Wang C‐k
Department Of Electrical Engineering National Cheng-kung University
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Wang Chin-kun
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tang University
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Liu L‐m
Taiwan Semiconductor Manufacturing Co. Ltd. Hsinchu Twn
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Liu Lu-min
Taiwan Semiconductor Manufacturing Company Ltd.
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LIN Mou-Shiung
Taiwan Semiconductor Manufacture Company
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Ying Tser-liang
Taiwan Semiconductor Manufacturing Company Ltd.
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WEI Chih-Shih
Taiwan Semiconductor Manufacturing Company Ltd.
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Cheng Huang-chung
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tang University
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