First-Principles Study of Electronic Properties in Si Lattice Matched SiGeC Alloy with a Low C Concentration
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概要
- 論文の詳細を見る
- 1999-09-20
著者
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YOKOYAMA Naoki
Fujitsu Laboratories Ltd.
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AWANO Yuji
Fujitsu Ltd.
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Awano Yuji
Fujitsu Lab. Ltd. Kanagawa Jpn
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Awano Y
Fujitsu Ltd. Atsugi Jpn
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Awano Yuji
Fujitsu Laboratories Ltd.
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OHFUTI Mari
MIRAI-Selete (Semiconductor Leading Edge Technologies, Inc.)
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OHFUTI Mari
Fujitsu Limited
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YOKOYAMA Naoki
Nanotechnology Research Center, Fujitsu Laboratories Ltd.
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Ohfuti Mari
Mirai-selete (semiconductor Leading Edge Technologies Inc.)
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Yokoyama Naoki
Nanotechnology Research Center Fujitsu Laboratories Ltd.
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