Fabrication of a Tantalum-Based Josephson Junction for an X-Ray Detector
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概要
- 論文の詳細を見る
We have fabricated a tantalum-based Josephson junction for an X-ray detector. The tantalum layer was selected for the junction electrode because of its long quasiparticle lifetime, large X-ray absorption efficiency and stability against thermal cycling. We have developed a buffer layer to fabricate the tantalum layer with a body-centered cubic structure. Based on careful consideration of their superconductivity, we have selected a niobium thin layer as the buffer layer for fabricating the tantalum base electrode, and a tungsten thin layer for the tantalum counter electrode. Fabricated Nb/AlO_x-Al/Ta/Nb and Nb/Ta/W/AlO_x-Al/Ta/Nb Josephson junctions exhibited current-voltage characteristics with a low subgap leakage current.
- 社団法人応用物理学会の論文
- 2000-06-15
著者
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YOKOYAMA Naoki
Fujitsu Laboratories Ltd.
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GOTOH Kohtaroh
Fujitsu Laboratories Ltd.
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Morohashi Shin'ichi
Department of Advanced Materials Science and Engineering, Faculty of Engineering, Yamaguchi University
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