Microscopic Observation of X-Ray Irradiation Damages in Ultra-Thin SiO_2 Films
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概要
- 論文の詳細を見る
- 2000-08-28
著者
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Yasuda Y
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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Yasuda Yukio
Department Of Applied Physics Osaka City University
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SAKAI Akira
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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ZAIMA Shigeaki
Center for Cooperative Research in Advanced Science and Technology, Nagoya University
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IKEDA Hiroya
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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OHMORI Kenji
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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Ikeda Hiroya
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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Yasuda Yukio
Shionogi Research Laboratories Shionogi & Co. Ltd.
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Zaima Shigeaki
Center For Cooperative Research In Advanced Science & Technology Nagoya University
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Ohmori Kenji
Pharmaceutical Research Institute Kyowa Hakko Kogyo Co. Ltd.
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Ohmori Kenji
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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GOTO Tomokazu
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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Ohmori K
Drug Development Research Laboratories Pharmaceutical Research Institute Kyowa Hakko Kogyo Co. Ltd
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Ohmori Koichi
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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OHMORI Kenji
Venture Business Laboratory, Nagoya University
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Goto Tomokazu
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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Yasuda Yukio
Department Of Applied Physics Faculty Of Engineering Nagoya University
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Sakai Akira
Department Of Agricultural Chemistry The University Of Tokyo
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