Microscopic Observation of X-Ray Irradiation Damage in Ultra-Thin SiO_2 Films
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-04-01
著者
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Yasuda Yukio
Department Of Applied Physics Osaka City University
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SAKAI Akira
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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ZAIMA Shigeaki
Center for Cooperative Research in Advanced Science and Technology, Nagoya University
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IKEDA Hiroya
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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GOTO Tomokazu
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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Ohmori Koichi
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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OHMORI Kenji
Venture Business Laboratory, Nagoya University
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