Carrier Injection into SiO_2 from Si Surface Driven to Avalanche Breakdown by a Linear Ramp Pulse, and Trapping, Distribution and Thermal Annealing of Injected Holes in SiO_2
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1975-10-05
著者
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林 康明
京都工芸繊維大学大学院
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HAYASHI Yutaka
Electrotechnical Laboratory
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NAGAI Kiyoko
Electrotechnical Laboratory
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Tarui Yasuo
Electrotechnical Laboratory
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Nagai Kiyoko
Electrotechnical Lab.
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TARUI Yasuo
National Institute of Advanced Industrial science and Technology
-
Tarui Yasuo
Electrotechnical Lab.
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