Minority Carrier Lifetime Measurement in HF Solution to Evaluate Si Substrates for Solar Cells
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概要
- 論文の詳細を見る
Minority carrier lifetime measurement using a microwave photoconductivity decay method was examined. A simple method of immersing a silicon wafer in a toxic HF solution by using a plastic envelope is introduced. An effective lifetime in 50% HF solution is much higher than that in air due to reduction of the surface recombination velocity and is almost the same compared with that of an oxidized and well-passivated substrate. This method provides the effective lifetime, which approximates a bulk lifetime, without an oxide layer and is useful in estimating the short circuit current of solar cells prior to the cell fabrication.
- 社団法人応用物理学会の論文
- 1990-01-20
著者
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HAYASHI Yutaka
Electrotechnical Laboratory
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Okamoto K
Tanaka Kikinzoku Kogyo Kk Kanagawa Jpn
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NAMMORI Takayuki
Energy Conversion Laboratories, Sharp Corporation
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OKAMOTO Koji
Energy Conversion Laboratories, Sharp Corporation
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NUNOI Tohru
Energy Conversion Laboratories, Sharp Corporation
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Nunoi Tohru
Energy Conversion Laboratories Sharp Corporation
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Nammori Takayuki
Energy Conversion Laboratories Sharp Corporation
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