Measurement of the Minority-Carrier Lifetime in a Semiconductor Wafer by a Two-Mercury-Probe Method and Its Application to Evaluation of the Surface Recombination Velocity

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1990-01-20

著者

• HAYASHI Yutaka

  Electrotechnical Laboratory

• SUZUKI Eiichi

  Electron Devices Division, Electrotechnical Laboratory

• Suzuki E

  Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology

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