Piezoelectric Properties of Se Film Deposited on Te Crystal
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概要
- 論文の詳細を見る
Se films deposited on Te crystals were studied as an ultrasonic transducer of a delay line and as a driver of a composite resonator. The values of electromechanical coupling factors κ_<11> and κ_<26> of Se were deduced as 0.15 and 0.27 respectively from the experimental and theoretical characteristics of the insertion loss of the delay line, and the value of the piezoelectric constant e_<11> was obtained as 0.17C/m^2 from these coupling factors.
- 社団法人応用物理学会の論文
- 1970-06-05
著者
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Tanaka Tetsuro
Department Of Electrical And Electronics Engineering Kagoshima University
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Shiosaki Tadashi
Department Of Electrical Engineering Ii Faculty Of Engineering Kyoto University
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Kawabata Akira
Department Of Electrical Engineering Ii Faculty Of Engineering Kyoto University
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Kawabata Akira
Department Of Chemistry Faculty Of Science Fukuoka University
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Tanaka Tetsuro
Department Of Biopharmaceutics School Of Pharmacy Fukuyama University
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