Thermal Effects in Properties of Photovoltaic Currents of Pb(Zr, Ti)O_3 Thin Films
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概要
- 論文の詳細を見る
Thermal effects in the characteristics of photovoltaic currents of Pb(Zr, Ti)O_3 (PZT) thin films were studied from room temperature up to 360℃. The photovoltaic currents at a steady state increased with increasing temperature and then decreased above 250℃. By conducting annealing for positively or negatively poled samples, the traces of photovoltaic currents gradually became symmetric, suggesting the improvement of crystallinity of PZT thin films and/or the formation of a symmetric pair of Schottky junctions at two interfaces with electrodes. Furthermore, this suggestion was supported by the significant improvement in the characteristics of hysteresis loops upon annealing.
- 社団法人応用物理学会の論文
- 1995-09-30
著者
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堀内 敏行
東京電機大学工学部
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松重 和美
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
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Shimizu M
Advanced Industrial Science And Technology (aist) Power Electronics Research Center
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Shimizu Mitsuaki
Power Electronics Research Center National Institute Of Advanced Industrial Science And Technology
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Matsushige Kazumi
Department Of Applied Science Faculty Of Engineering Kyushu University
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Shiosaki Tadashi
Research Development Division Sakai Chemical Industry Co. Ltd.
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Shiosaki Tadashi
Department Of Electrical Engineering Ii Faculty Of Engineering Kyoto University
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Horiuchi Toshihisa
Department Of Applied Physics Faculty Of Engineering Kyushu University
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Matsumura A
Department Of Physiology Osaka City University Graduate School Of Medicine
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Tokuhisa Hiroaki
Department Of Materials Science And Technology Graduate School Of Engineering Sciences Kyushu Univer
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Matsumura Akira
Department Of Gastroenterology Dokkyo Medical University
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Shimizu Masaru
Department Of Chemical Engineering Faculty Of Engineering Tokyo University Of Agriculture And Techno
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KAMAIKE Yasuyuki
Department of Electronic Science and Engineering, Faculty of Engineering, Kyoto University
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Kamaike Yasuyuki
Department Of Electronic Science And Engineering Faculty Of Engineering Kyoto University
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MATSUMURA Akira
Department of Electronic Science and Engineering, Faculty of Engineering, Kyoto University
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