In-Situ X-Ray Observation of Molecular Structure in Organic Thin Films during Evaporation Process by Total Reflection In-Plane X-Ray Diffractometer0
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1992-12-15
著者
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ISHIDA Kenji
Department of Physics, Graduate School of Science, Kyoto University
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堀内 敏行
東京電機大学工学部
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Hayashi K
Kyoto Univ. Kyoto Jpn
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Hayashi Kouichi
Department Of Materials Science And Engineering Kyoto University
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Ishida Koichi
Optoelectronics Joint Research Laboratory:(present Address) Fundamental Research Laboratories Nec Co
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MATSUSHIGE Kazumi
Department of Electronic Science and Engineering, Kyoto University
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HORIUCHI Toshihisa
Department of Electric Science and Engineering, Graduated School of Kyoto University
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Ishida K
Yamagata Univ. Yamagata Jpn
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Matsushige Kazumi
Department Of Applied Science Faculty Of Engineering Kyushu University
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Hayashi Kouichi
Department Of Materials Science And Engineering Koyto University
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Horiuchi Toshihisa
Department Of Applied Physics Faculty Of Engineering Kyushu University
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Tokuhisa Hiroaki
Department Of Materials Science And Technology Graduate School Of Engineering Sciences Kyushu Univer
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Ishida Kenji
Department Of Chemical Science And Engineering Graduate School Of Engineering Kobe University
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石田 謙司
神戸大学 大学院工学研究科
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Ishida Kenji
Department of Applied Chemistry, Ibaraki University
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