Simultaneous Analysis of Total Reflection X-Ray Diffraction and Fluorescence from Copper-Phthalocyanine Thin Films during Evaporation Process
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1995-12-15
著者
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原 一広
「応用物理」編集委員会
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堀内 敏行
東京電機大学工学部
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松重 和美
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
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Hayashi K
Kyoto Univ. Kyoto Jpn
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Hayashi Kouichi
Department Of Materials Science And Engineering Kyoto University
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MATSUSHIGE Kazumi
Department of Electronic Science and Engineering, Kyoto University
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HORIUCHI Toshihisa
Department of Electric Science and Engineering, Graduated School of Kyoto University
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Matsushige Kazumi
Department Of Applied Science Faculty Of Engineering Kyushu University
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Hayashi Kouichi
Department Of Materials Science And Engineering Koyto University
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Horiuchi Toshihisa
Department Of Applied Physics Faculty Of Engineering Kyushu University
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Tokuhisa Hiroaki
Department Of Materials Science And Technology Graduate School Of Engineering Sciences Kyushu Univer
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