Extraction of Trap Densities at Front and Back Interfaces in Thin-Film Transistors

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2004-01-15

著者

• 木村 睦

  龍谷大学電子情報学科

• 井上 聡

  セイコーエプソン株式会社フロンティアデバイス研究所

• 下田 達也

  Center For Nano Materials And Technology Japan Advanced Institute Of Science And Technology

• 木村 睦

  Department Of Electronics And Informatics Ryukoku University

• KIMURA Mutsumi

  Department of Electronics and Informatics, Ryukoku University

• INOUE Satoshi

  Technology Platform Research Center, Seiko Epson Cooperation

• SHIMODA Tatsuya

  Technology Platform Research Center, Seiko Epson Cooperation

• TAM Simon

  Cambridge Research Laboratory of Epson

• Kimura Mutsumi

  Ryukoku University:innovative Materials And Processing Research Center

• Shimoda Tatsuya

  Seiko Epson Corp. Nagano Jpn

• Inoue S

  Seiko Epson Corporation

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