Time-Ratio Grayscale and Hopping Scan with Current Uniformization for Thin-Film Transistor Driven Organic Light-Emitting Diode Displays (Special Issue: Active-Matrix Liquid-Crystal Displays--TFT Technologies and Related Materials)
スポンサーリンク
概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
-
木村 睦
Department Of Electronics And Informatics Ryukoku University
-
Kimura Mutsumi
Ryukoku University:innovative Materials And Processing Research Center
関連論文
- Extraction Technique of Trap Density at Grain Boundaries in Polycrystalline-Silicon Thin-Film Transistors with Device Simulation
- Classification of Driving Methods for TFT-OLEDs and Novel Proposal Using Time Ratio Grayscale and Current Uniformization(Electronic Displays)
- 表側と裏側の絶縁膜界面にトラップ準位をもつポリシリコン薄膜トランジスタのデバイスシミュレーション(ディスプレイ-IDW'03関連-)
- Extraction of Trap Densities at Front and Back Interfaces in Thin-Film Transistors
- Poly-Si TFT特性の酸化膜界面トラップと結晶粒界トラップに対する依存性およびその製造プロセス診断への応用(半導体Si及び関連材料・評価)
- Numerical Model of Thin-Film Transistors for Circuit Simulation Using Spline Interpolation with Transformation by y=x + log(x)(Regular Section)
- 多結晶シリコン薄膜トランジスタの絶縁膜-シリコン界面と結晶粒界のトラップ準位の抽出(低温または高温多結晶Siとアクティブマトリックス型ディスプレイ用薄膜トランジスタ論文特集)
- 多結晶シリコン薄膜トランジスタの特性解析とシミュレーション
- 多結晶シリコン薄膜トランジスタの特性解析とシミュレーション
- Extraction of Trap States at the Oxide-Silicon Interface and Grain Boundary for Polycrystalline Silicon Thin-Film Transistors : Semiconductors
- Current Density Enhancement at Active Layer Edges in Polycrystalline Silicon Thin-Film Transistors : Semiconductors
- Energy Transfer in Light-Harvesting Small Dendrimers Having π-Conjugated Aromatic Rings
- Device Simulation of Carrier Transport through Grain Boundaries in Lightly Doped Polysilicon Films and Dependence on Dopant Density : Semiconductors
- Current Paths over Grain Boundaries in Polycrystalline Silicon Films : Semiconductors
- Determination of the Anisotropic Refractive Indices of Twisted Nematic Liquid Crystals by Means of Renormalized Transmission Ellipsometry : Instrumentation, Measurement, and Fabrication Technology
- Determination of Film Thickness and Anisotropy of the Refractive Indices in 4-octyl-4'-cyanobiphenyl Liquid Crystalline Free-Standing Films
- Pulse-Width Modulation with Current Uniformization for TFT-OLEDs(Electronic Displays)
- Device Simulation of grain Boundaries with Oxide-Silicon Interface Roughness in Laser-Crystallized Polycrystalline Silicon Thin-Film Transistors
- 24.4:Investigation of Hot Carrier Degradation Due to AC Stress in Low Temperature Poly-Si TFTs(発表概要)(Report on 2000 SID International Symposium)
- Relationship between Surface Order and Surface Azimuthal Anchoring Strength on Polyimide with Linearly Polarized Ultraviolet Light Exposure
- Offset of Multiple-Beam Interference inside Anisotropic Multilayered Structure : Determination of Polar Anchoring Strength at Nematic Liquid Crystal-Wall Interface
- Time-Ratio Grayscale and Hopping Scan with Current Uniformization for Thin-Film Transistor Driven Organic Light-Emitting Diode Displays (Special Issue: Active-Matrix Liquid-Crystal Displays--TFT Technologies and Related Materials)
- Determination of Director Profile of Twisted Nematic Liquid Crystal Cell with Tilted Surface Alignment by Renormalized Transmission Ellipsometry
- Surface Azimuthal Anchoring Energy between the Grating Surface and Nematic Liquid Crystal Layer Studied by Finite Element Method
- Measurement of Genuine Azimuthal Anchoring Energy in Consideration of Liquid Crystal Molecular Adsorption on Alignment Film
- Quantitative Analysis of Nematic Director Reorientation Dynamics Studied by Time-Resolved Spectroscopic Ellipsometry
- Dynamics of Surface-Stabilized Ferroelectric Liquid Crystals at the Alignment Layer Surface Studied by Total-Reflection Ellipsometry : Structure and Mechanical and Thermal Properties of Condensed Matter
- Analysis of Totally Reflected Light from Liquid Crystal Cell using Renormalized Ellipsometry
- Test Structure for the Evaluation of Si Substrates (Special Issue on Microelectronic Test Structure)
- Optical Properties of 4-Octyl-4'-Cyanobiphenyl Liquid-Crystalline Free-Standing Films
- Transmission Ellipsometry of 4-Octyl-4'-Cyanobiphenyl Liquid-Crystalline Free-Standing Films
- Observation of Nematic Liquid Crystal Director Reorientation at the Interface between Substrate and Liquid Crystal Layer by Total Reflection Ellipsometry
- Analysis of Liquid Crystal Orientation at Interface between Liquid Crystal and Alignment Film by Total Reflection Ellipsometry