Time-Ratio Grayscale and Hopping Scan with Current Uniformization for Thin-Film Transistor Driven Organic Light-Emitting Diode Displays

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概要

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• A driving method using time-ratio grayscale and hopping scan with current uniformization has been developed for thin-film transistor (TFT) driven organic light-emitting diode displays. The easiness of pixel charging is superior to that of conventional current program driving. A TFT characteristic is measured, and design parameters are optimized. It is confirmed using a circuit simulator that this driving method maintains current uniformity and simultaneously overcomes charging shortage of the pixel circuit for low grayscale levels and current variation due to the shift of operating points. The influence of feed-through voltage can be neglected by optimizing design parameters. Moreover, it is also confirmed using an image simulator that grayscale linearity and luminance uniformity against the TFT characteristic deviation are much improved.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2006-05-30

著者

• KIMURA Mutsumi

  Department of Electronics and Informatics, Ryukoku University

• INOUE Satoshi

  Technology Platform Research Center, Seiko Epson Cooperation

• Hara Yuji

  Department Of Electrical And Electronic Engineering Faculty Of Engineering Okayama University

• Shimoda Tatsuya

  Technology Platform Research Center Seiko Epson Corp.

• Kato Masakazu

  Department of Electronics and Informatics, Ryukoku University, Seta, Otsu 520-2194, Japan

• Hara Hiroyuki

  Technology Platform Research Center, Seiko Epson Corporation, 281 Fujimi, Nagano 399-0293, Japan

• Okuyama Tomoyuki

  Technology Platform Research Center, Seiko Epson Corporation, 281 Fujimi, Nagano 399-0293, Japan

• Kimura Mutsumi

  Department of Chemistry, Graduate School of Natural Science and Technology, Okayama University

• Kimura Mutsumi

  Department of Electronics and Informatics, Ryukoku University, Seta, Otsu 520-2194, Japan

• Hara Yuji

  Department of Electronics and Informatics, Ryukoku University, Seta, Otsu 520-2194, Japan

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