Analysis of Degradation Phenomenon Caused by Self-Heating in Low-Temperature-Processed Polycrystalline Silicon Thin Film Transistors
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-11-15
著者
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INOUE Satoshi
Technology Platform Research Center, Seiko Epson Cooperation
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SHIMODA Tatsuya
Technology Platform Research Center, Seiko Epson Cooperation
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Shimoda Tatsuya
Technology Platform Research Center Seiko Epson Corporation
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Shimoda Tatsuya
Technology Platform Research Center Seiko Epson Corp.
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OHSHIMA Hiroyuki
Displays Operations Division, Seiko Epson Corporation
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Ohshima Hiroyuki
Displays Operations Division Seiko Epson Corporation
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